Threshold voltage and mobility extraction of NBTI degradation of poly-Si thin-film transistors

Journal

IEEE Transactions on Electron Devices

Journal Volume

57

Journal Issue

11

Pages

3186-3189

Date Issued

2010

Author(s)

Sun, H.-C.

Huang, C.-F.

Chen, Y.-T.

Wu, T.-Y.

Liu, C.W.

Hsu, Y.-J.

Chen, J.-S.

DOI

10.1109/TED.2010.2068550

URI

http://www.scopus.com/inward/record.url?eid=2-s2.0-78049303984&partnerID=MN8TOARS

http://scholars.lib.ntu.edu.tw/handle/123456789/358240

Type

journal article