Structural studies of high-K-u metastable CoPt thin films with long-range order
Resource
JOURNAL OF APPLIED PHYSICS, 111(7), 07A303
Journal
Journal of Applied Physics
Pages
07A303
Date Issued
2012
Date
2012
Author(s)
Yuan, Fu-Te
Hsu, Jen-Hwa
Lin, Yi-Hung
Hsiao, S.N.
Lee, H.Y.
Abstract
The symmetries of CoPt thin films in different phases, including disordered A1, ordered L1 1, and L1 0 were examined by making measurements along the (10.1) diffraction rod. The films were deposited by sputtering on MgO(111) substrates at different temperatures (T a). The stacking sequence of close-packed atomic planes in 50 nm-thick samples with T a 200°C was identified as ABCABC, indicating that the distribution of defects in the film was random, so the symmetry was preserved with increasing T a. In the RT-prepared film, a considerable amount of (∼62.9 vol.) disordered CoPt with hexagonal symmetry was detected, vanishing as T a increased. Defect-induced modification of symmetry was observed in the L1 1 film as its thickness was reduced to 10 nm. A pseudo-hcp component of around 7.1 vol. was present in the film, as a result of the periodic distribution of defects. The defects in the structure may also explain the broadened magnetic alignment. © 2012 American Institute of Physics.
Type
journal article
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