Evidence for PT-ferroelectrics interface scenario of different fatigue behaviors between Bi4Ti3O12 and Bi3.25La0.75Ti3O12 thin film capacitors

Journal

Materials Science in Semiconductor Processing

Journal Volume

5

Journal Issue

2-3

Pages

179-182

Date Issued

2002

Author(s)

Ganne, M.

Tessier, P.Y.

Eon, D.

Caldes, M.T.

Brohan, L.

DOI

10.1016/S1369-8001(02)00102-6

URI

https://www.scopus.com/inward/record.uri?eid=2-s2.0-0036557643&doi=10.1016%2fS1369-8001%2802%2900102-6&partnerID=40&md5=1286792d2674e27cb7948750c0daf569

https://scholars.lib.ntu.edu.tw/handle/123456789/485613

Type

conference paper