Fabrication and low temperature characterization of Ge (110) and (100) p-MOSFETs

Journal

IEEE Transactions on Electron Devices

Journal Volume

61

Journal Issue

6

Pages

2215-2219

Date Issued

2014

Author(s)

Wong, I.-H.

Chen, Y.-T.

Yan, J.-Y.

Ciou, H.-J.

Chen, Y.-S.

DOI

10.1109/TED.2014.2318083

URI

http://www.scopus.com/inward/record.url?eid=2-s2.0-84901315136&partnerID=MN8TOARS

http://scholars.lib.ntu.edu.tw/handle/123456789/387386

Type

journal article