Accurate Attenuation Determination with One-Port Measurements
Journal
Asia-Pacific Microwave Conference Proceedings, APMC
ISBN
9781665494182
Date Issued
2023-01-01
Author(s)
Wang, Li Hsien
Abstract
This paper presents a one-port measurement to reconstruct the scattering matrix (S-matrix) of a two-port network by a frequency-shift method. This method would simplify the test sequence and keep the acceptable tolerance to measure the attenuation of a two-port device under test (DUT). An auxiliary circuit is implemented to respond to different impedances at different frequencies as a terminator at the second port of the two-port DUT. Formulation to reconstruct the two-port DUT is presented. This one-port measurement method provides acceptable accuracy in measuring attenuation coefficients compared to the conventional two-port method. The formula of the reconstructed two-port S-matrix is verified by experiment in the frequency range from 8 GHz to 12 GHz.
Subjects
and measurement method | calibration | one-port measurement | S-matrix
Type
conference paper