A Parallel Beam Scanning System for Flatness Measurement of Thin Plates
Resource
Proc. of the 2nd Int. ISMTII'93 Conf., SPIE, China Wuhan(1993.11)
Journal
Proc. of the 2nd Int. ISMTII'93 Conf., SPIE, China Wuhan(1993.11)
Pages
-
Date Issued
1993-11
Date
1993-11
Author(s)
Fan, K. C.
Type
conference paper