Skip to main content
English
中文
Log In
Log in
Log in with ORCID
NTU Single Sign On
Have you forgotten your password?
Home
College of Electrical Engineering and Computer Science / 電機資訊學院
Electronics Engineering / 電子工程學研究所
Cryogenic performance of a 200 GHz SiGe HBT technology
Details
Cryogenic performance of a 200 GHz SiGe HBT technology
Journal
Proceedings of the IEEE Bipolar/BiCMOS Circuits and Technology Meeting
Pages
171-173
Date Issued
2003
Author(s)
YI-JAN EMERY CHEN
URI
http://www.scopus.com/inward/record.url?eid=2-s2.0-1042277555&partnerID=MN8TOARS
http://scholars.lib.ntu.edu.tw/handle/123456789/301716
Type
conference paper