Group IV Element Metal-Oxide-Semiconductor Light Emitting Devices
Date Issued
2008
Date
2008
Author(s)
Tzer An, Hung
Abstract
In this thesis, various metal-oxide-semiconductor light-emitting-devices (MOS LED) were fabricated and investigated of their luminescence characteristics. The MOS LED structures include the Ge MOS LED with silicon dioxide (SiO2), Ge MOS LED with aluminum oxide (Al2O3) and the 6H-SiC MOS LED. nfrared emission is observed from the Ge MOS LED. A spectral line fit is performed on the luminescence spectrum with the electron-hole-plasma (EHP) recombination model with 5 phonon assisted replica, including TO, LA, TA emission, and TA, LA absorption. Intensity of the TA phonon absorption is seen to increase at elevated temperatures. Reduced thermal quenching in electroluminescence compared to photoluminescence measurements is due to the large difference in concentration between the majority and minority carriers in EL, which limits the cause of the decrease of radiative recombination probability to only the lowering of the minority concentration. The Ge MOS LED with Al2O3 insulator shows improvements in performance that include smaller operating voltage, smaller leakage current, stronger light emission, reduced nonradiative radiation and an increase in light emission intensity at elevated operation temperatures. Blue luminescence at reverse bias is observed in the 6H-SiC MOS LED.
Subjects
MOS
LED
6H-SiC
EL
thermal quenching
Type
thesis
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