Multilevel routing with jumper insertion for antenna avoidance
Journal
IEEE International SOC Conference
Pages
63-66
Date Issued
2004
Author(s)
Abstract
As technology advances into nanometer territory, the antenna problem has caused significant impact on routing tools. The antenna effect is a phenomenon of plasma-induced gate oxide degradation caused by charge accumulation on conductors. It directly influences reliability, manufacturability and yield of VLSI circuits, especially in deep-submicron technology using high density plasma. Furthermore, the continuous increase of the problem size of IC routing is also a great challenge to existing routing algorithms. In this paper, we propose a framework for multilevel full-chip routing with antenna avoidance using built-in jumper insertion approach. Compared with the state-of-the-art multilevel routing, the experimental results show that our approach reduced 100% antenna-violated gates and results in fewer wirelength, vias, and delay increase.
Type
conference paper
File(s)![Thumbnail Image]()
Loading...
Name
01362351.pdf
Size
387.87 KB
Format
Adobe PDF
Checksum
(MD5):1524884db86cf7c31165d15ffc051c7f