Test time reduction for scan-designed circuits by sliding compatibility

Resource

Test Symposium, 1994., Proceedings of the Third Asian

Journal

Test Symposium, 1994.

Pages

-

Date Issued

1994-11

Date

1994-11

Author(s)

Chang, Jau-Shien

Lin, Chen-Shang

DOI

DOI

N/A

URI

Type

journal article

File(s)

Name

00367210.pdf

Size

624.15 KB

Format

Adobe PDF

Checksum

(MD5):e2197b3fb3327d281754c0013790d3bb