A Cell Modeling Technique for Accurate IR-Drop Analysis
Date Issued
2010
Date
2010
Author(s)
Pan, Hsin-Chieh
Abstract
As the process technologies continue to shrink and design complexity increases, the IR-drop effect becomes an important factor determining the performance and reliability of a design. Several IR-drop analysis techniques have been proposed to address this issue by current-based modeling. The accuracy of IR-drop analysis depends on the quality of the current waveform approximation. Two effects can influence IR-drop analysis, that is, the local charge sharing effect and the relation between gate current and IR-drop effect. Ignoring these two effects in current-based modeling induce inaccuracy in IR-drop analysis.
This thesis focuses on the current waveform approximation and modeling the two effects impacting IR-drop. The core technology is applying current source, switches and fundamental circuit components on power network to improve the accuracy of IR-drop analysis.
The accuracy of the proposed technique is validated on ISCAS85 benchmark circuits. The proposed technique concerning two effects together achieves higher accuracy when test circuit suffering less severe IR-drop.
This thesis focuses on the current waveform approximation and modeling the two effects impacting IR-drop. The core technology is applying current source, switches and fundamental circuit components on power network to improve the accuracy of IR-drop analysis.
The accuracy of the proposed technique is validated on ISCAS85 benchmark circuits. The proposed technique concerning two effects together achieves higher accuracy when test circuit suffering less severe IR-drop.
Subjects
cell modeling
IR-drop
Type
thesis
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