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College of Electrical Engineering and Computer Science / 電機資訊學院
Electrical Engineering / 電機工程學系
Nearly defect-free Ge gate-all-around FETs on Si substrates
Details
Nearly defect-free Ge gate-all-around FETs on Si substrates
Journal
International Electron Devices Meeting, IEDM
Date Issued
2011
Author(s)
CHEE-WEE LIU
DOI
10.1109/IEDM.2011.6131676
URI
http://www.scopus.com/inward/record.url?eid=2-s2.0-84863045902&partnerID=MN8TOARS
http://scholars.lib.ntu.edu.tw/handle/123456789/365227
Type
conference paper
