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College of Electrical Engineering and Computer Science / 電機資訊學院
Electrical Engineering / 電機工程學系
A leakage-current-recycling phase-locked loop in 65nm CMOS technology
Details
A leakage-current-recycling phase-locked loop in 65nm CMOS technology
Journal
IEEE Asian Solid-State Circuits Conference (A-SSCC)
Pages
137-140
Date Issued
2011-11
Author(s)
I-Ting Lee
Yun-Ta Tsai
SHEN-IUAN LIU
DOI
10.1109/ASSCC.2011.6123621
URI
http://scholars.lib.ntu.edu.tw/handle/123456789/366451
Type
conference paper
