Polarization-resolved fine-structure splitting of zero-dimensional In xGa1-xN excitons
Journal
Physical Review B - Condensed Matter and Materials Physics
Journal Volume
83
Journal Issue
20
Pages
201307-1 - 201307-4
Date Issued
2011
Author(s)
Abstract
The fine-structure splitting of quantum confined InxGa 1-xN excitons is investigated using polarization-sensitive photoluminescence spectroscopy. The majority of the studied emission lines exhibits mutually orthogonal fine-structure components split by 100-340 μeV, as measured from the cleaved edge of the sample. The exciton and the biexciton reveal identical magnitudes but reversed sign of the energy splitting. © 2011 American Physical Society.
SDGs
Publisher
American Physical Society
Type
journal article