A built-in technique for measuring substrate and power supply digital switching noise using PMOS-based differential sensors and a waveform sampler in system-on-chip applications

Resource

IEEE Transactions on Instrumentation and Measurement, 56(6), 2330-2337

Journal

IEEE Transactions on Instrumentation and Measurement

Journal Volume

56

Journal Issue

6

Pages

2330-2337

Date Issued

2007

Date

2007

Author(s)

Iorga, C.

Dutton, R.W.

URI

Type

journal article

File(s)

Name

03.pdf

Size

23.21 KB

Format

Adobe PDF

Checksum

(MD5):18e1f557835572a8b0ef88632def1ece