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Microwave diversity imaging using six-port reflectometer
Journal
IEEE Transactions on Microwave Theory and Techniques
Journal Volume
47
Journal Issue
1
Pages
84-87
Date Issued
1999
Date
1999
Author(s)
Abstract
A microwave diversity imaging system conventionally uses a vector network analyzer (VNA) to directly measure the object scattered field (amplitude and phase) over a selected frequency range and viewing angles, then reconstructs the scattering object characteristic function through two-dimensional Fourier inversion. In this paper, we present a cost-effective microwave diversity imaging system using a six-port reflectometer, which measures four amplitude (or power) values to acquire the object scattered field indirectly. One can then eliminate the coherent detectors in a VNA. The calibration procedure for this microwave diversity imaging measurement is also described. Experimental results of three types of scattering objects, a metallic cylinder, four distributed line scatterers, and a 72:1 scaled B-52 aircraft model, are presented using the described six-port microwave imaging system. © 1999 IEEE.
Subjects
Microwave diversity imaging; Six-port reflectometer
Other Subjects
Calibration; Electromagnetic wave scattering; Fourier transforms; Imaging systems; Microwave devices; Microwave diversity imaging; Reflectometers
Type
journal article
File(s)
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Name
02.pdf
Size
173.49 KB
Format
Adobe PDF
Checksum
(MD5):8a903aaec8a9a98bdd192f7d90f1adee