Built-in Self-Test Circuits for RF Frontend
Date Issued
2007
Date
2007
Author(s)
Huang, Yen-Chih
DOI
en-US
Abstract
The fast-growing market in personal wireless communications has motivated the development of fully integrated transceivers using a cost-efficient CMOS process. By integrating the radio-frequency (RF) frontend, baseband transceivers, and digital circuitry, the chip area and the fabrication cost can be effectively reduced. However, with the increasing complexity in the circuit designs, the test of the fully integrated system has become one of the most challenging tasks to take the full advantage of the SoC concept. In recent years, some built-in self-test (BIST) techniques have been applied to the RF field, trying to overcome the test difficulties and reduce the production cost. Nowadays the RF BIST is still on the early-stage development, thus it is worth building an effective and practical topology for the frontends. In this thesis, three BIST topologies are proposed to extract the RF parameters for VCO and LNA in frontend circuits.
In chapter 3, a built-in self-test (BIST) architecture is proposed for the voltage-controlled oscillators (VCOs) operating at multi-gigahertz frequencies. By utilizing a frequency divider and a frequency-to-voltage converter (FVC), the output frequency and the tuning range of the VCOs can be extracted without external test instruments. Based on the experimental results, the BIST module provides on-chip frequency measurement from 2.5 to 6.2 GHz with sufficient accuracy. The proposed BIST module is integrated with a wideband VCO as the DUT in a 0.18-
Subjects
射頻
內建自我測試
低雜訊放大器
壓控振盪器
RF
BIST
LNA
VCO
Type
thesis
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