Two-dimensional dopant profiling by electrostatic force microscopy using carbon nanotube modified cantilevers

Journal

Nanotechnology

Journal Volume

19

Journal Issue

32

Date Issued

2008

Author(s)

Chin, S.-C.

Chang, Y.-C.

Hsu, C.-C.

Lin, W.-H.

Wu, C.-I.

Chang, C.-S.

Tsong, T.T.

Woon, W.-Y.

Lin, L.-T.

Tao, H.-J.

DOI

10.1088/0957-4484/19/32/325703

URI

http://www.scopus.com/inward/record.url?eid=2-s2.0-47249118727&partnerID=MN8TOARS

http://scholars.lib.ntu.edu.tw/handle/123456789/341454

Type

journal article