Transition characterization using TRL calibration method with unequal “R” calibrators
Date Issued
2009
Author(s)
Yien-Tien Chou
Abstract
Traditional TRL calibration method assumes equal reflection at both reflection calibrators. However, process variation during circuit fabrication may result in unequal reflection calibrators. Correction equations are proposed under symmetrical transitions situation. More stable scattering parameters are obtained for single transition using proposed equations. Close results are also obtained for combined characterized transitions using correction equations and directly measured transitions.
Type
conference paper