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College of Electrical Engineering and Computer Science / 電機資訊學院
Photonics and Optoelectronics / 光電工程學研究所
Characterization of MOCVD-grown CdMnTe films by infrared spectroscopy
Details
Characterization of MOCVD-grown CdMnTe films by infrared spectroscopy
Resource
J. Electronic Materials,18,453-455.
Journal
J. Electronic Materials
Journal Issue
18
Pages
453-455
Date Issued
1989-01
Date
1989-01
URI
http://ntur.lib.ntu.edu.tw//handle/246246/193790
Type
journal article