Development of Essential Patent Indicator Based on Modified Citation Counts
Date Issued
2006
Date
2006
Author(s)
Hu, Huei-Jie
DOI
en-US
Abstract
A systematic methodology to analyze the quality of patents is developed and presented in this thesis. We focus on patents which belong to a particular technology and develop an indicator of patent quality by using patent citation data. Traditional simple patent citation counts are not informative enough to be used for patent quality classification. We analyze patent citations and establish an essential patent indicator by considering several critical factors. The first is time factor, the second is assignee factor, the third is self and other citation factor, and the fourth is citation layer factor. Citations are calculated by considering first the time factor and then modifed by the other three factors. With essential patent indicator we can provide a patent quality index and discover the trend of the technology used by enterprises who have better knowledge in the quality of these technologies.
Subjects
專利
指標
修正引用數
Patent
Indicator
Modified Citation Counts
Type
thesis
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