Test Time Reduction for Scan-Designed Circuits by Sliding Compatibility

Resource

Asian Test Symposium, Nara, Japan(1994.11)

Proceedings of Asian Test Sysmposium, p.330-335

Journal

Asian Test Symposium

Journal Issue

Nara

Pages

-

Date Issued

1994

Date

1994

Author(s)

Lin, Chen-Shang

URI

Type

conference paper