Automatic TFT-LCD mura defect inspection using discrete cosine transform-based background filtering and 'just noticeable difference' quantification strategies

Journal

Measurement Science and Technology

Journal Volume

19

Journal Issue

1

Date Issued

2008

Author(s)

Chen, L.-C.

Kuo, C.-C.

LIANG-CHIA CHEN

DOI

10.1088/0957-0233/19/1/015507

URI

https://scholars.lib.ntu.edu.tw/handle/123456789/447882

URL

https://www.scopus.com/inward/record.uri?eid=2-s2.0-38849172631&doi=10.1088%2f0957-0233%2f19%2f1%2f015507&partnerID=40&md5=aad0e200a124467d36697e91874d31b4

Type

journal article