A single-element CMOS-based electronic de-embedding technique with TRL level of accuracy

Journal

2015 IEEE MTT-S International Microwave Symposium, IMS 2015

Date Issued

2015

Author(s)

簡俊超

DOI

10.1109/MWSYM.2015.7166871

URI

https://www.scopus.com/inward/record.uri?eid=2-s2.0-84946095057&doi=10.1109%2fMWSYM.2015.7166871&partnerID=40&md5=280b511b0a315dfc3b34f40b1af363eb

https://scholars.lib.ntu.edu.tw/handle/123456789/552443

Type

conference paper