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  4. Hot carrier induced photothermal effect on metal-semiconductor schottky junction
 
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Hot carrier induced photothermal effect on metal-semiconductor schottky junction

Journal
Proceedings of SPIE - The International Society for Optical Engineering
Journal Volume
11831
Date Issued
2021
Author(s)
Sun R.-L
Lai H.-H
CHING-FUH LIN  
DOI
10.1117/12.2593817
URI
https://www.scopus.com/inward/record.uri?eid=2-s2.0-85113835508&doi=10.1117%2f12.2593817&partnerID=40&md5=df4fe18ae65f3a5fe4ac8f96d654fd5b
https://scholars.lib.ntu.edu.tw/handle/123456789/607037
Abstract
Recent progress in plasmonic absorption devices provides a new way of photon-electron conversion through hot carrier emission if a carrier possesses sufficient energy to overcome the Schottky barrier. However, the behavior of carriers with energy lower than that of the barrier has rarely been discussed, while it could be very useful if the energy is converted efficiently. Very recently, the photothermal effect, which used to be treated as an energy loss, is used to detect low energy photons. Here, we systematically and quantitatively analyzed the mechanism of this effect, which, to the best of our knowledge, has not yet been determined stringently. A very thin layer of Ni is deposited on n-type Si (n-Si) with an electron-beam evaporator, and annealed by rapid thermal processer to form a NiSi/n-Si Schottky junction. The device was measured under intermittent light illumination with several incident power and bias. Under 0.05 V forward bias, the device generates a photothermal assisted response, which is boosted by 23% of the traditional photoelectric response at 1550 nm in 5 s. The response in different incident wavelengths is also presented in this work. The photothermal response is caused by low energy carriers, which dissipates thermally and heats the interface locally, causing the change of the electrical characteristics of the device. This effect could be used to detect signals regardless of wavelength and has a potential in future low energy photon conversion technology. ? 2021 SPIE. All rights reserved.
Subjects
Hot carrier
Infrared sensing
MWIR
Photothermal
Schottky diode
SWIR
Energy dissipation
Hot carriers
Infrared detectors
Infrared devices
Photons
Schottky barrier diodes
Silicon
Electrical characteristic
Electron beam evaporators
Incident wavelength
Low energy photons
Metal semiconductors
Photoelectric response
Photothermal effects
Photothermal response
Semiconductor junctions
SDGs

[SDGs]SDG3

Type
conference paper

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