Superior n-MOSFET performance by optimal stress design

Journal

IEEE Electron Device Letters

Journal Volume

29

Journal Issue

4

Pages

402-404

Date Issued

2008

Author(s)

Yeh, L.

Lee, T.-L.

Liu, C.W.

DOI

10.1109/LED.2008.918420

URI

http://www.scopus.com/inward/record.url?eid=2-s2.0-41749109325&partnerID=MN8TOARS

http://scholars.lib.ntu.edu.tw/handle/123456789/341140

SDGs

[SDGs]SDG7

Type

journal article