MOSFET Drain Breakdown Voltage

Resource

IEEE Transactions on Electron Device Letters, v.EDL-7 n.7, p.449-450

Journal

IEEE Transactions on Electron Device Letters

Journal Volume

v.EDL-7 n.7

Pages

449-450

Date Issued

1986-10

Date

1986-10

Author(s)

Feng, Wu-Shiung

URI

Type

journal article