Photoreflectance study of barrier-width dependence of above-barrier states in GaAs-Al<inf>x</inf>Ga<inf>1-x</inf>As multiple quantum wells

Photoreflectance study of barrier-width dependence of above-barrier states in GaAs-AlxGa1-xAs multiple quantum wells

Journal

Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers

Journal Volume

36

Journal Issue

9 A

Pages

5448-5450

Date Issued

1997

Author(s)

Chen, Y.F.

Chen, M.C.

Lin, H.H.

Lin, D.Y.

Huang, Y.S.

URI

Type

journal article