IEEE standard 1500 compatible interconnect diagnosis for delay and crosstalk faults
Journal
Proceedings of the Asia and South Pacific Design Automation Conference, ASP-DAC
Journal Volume
2006
Pages
366-371
Date Issued
2006
Author(s)
Abstract
We propose an interconnect diagnosis scheme based on Oscillation Ring test methodology for SOC design with heterogeneous cores. The target fault models are delay faults and crosstalk glitches. We analyze the diagnosability of an interconnect structure and propose a fast diagnosability checking algorithm and an efficient diagnosis ring generation algorithm which achieves the optimal diagnosability. Two optimization techniques improve the efficiency and effectiveness of interconnect diagnosis. In all experiments, our method achieves 100% fault coverage and the optimal diagnosis resolution. © 2006 IEEE.
Other Subjects
Algorithms; Computer aided design; Crosstalk; Delay circuits; Microprocessor chips; Delay faults; Interconnect diagnosis; Interconnect structures; Optimal diagnosability; Interconnection networks
Type
conference paper