Study of the Emission Characteristics of InGaN/GaN and CdZnO/ZnO Quantum-well Structures with the Photoluminescence Spectroscopy
Date Issued
2012
Date
2012
Author(s)
Chung, Wei-Lun
Abstract
In this study, we demonstrate the emission characteristics in InGaN/GaN QWs and in CdZnO/ZnO QWs with photoluminescence measurements. First, temperature-dependent photoluminescence and excitation power-dependent photoluminescence are performed on InGaN/GaN QWs with an InGaN-based diode laser (λ=406nm). The counteraction between the increased carrier localization effect in the QWs, which is caused by the thermal annealing process, and the enhanced quantum-confined Stark effect in the QWs, which is caused by the increased piezoelectric field, when the different thickness of p-type layer is grown at a high temperature on the InGaN/GaN QWs is illustrated. Next, we demonstrate the results of temperature-dependent photoluminescence and excitation power-dependent photoluminescence with a He-Cd laser (λ=325nm) to understand the emission behaviors of the CdZnO/ZnO QW on GaN and ZnO templates. With two-Gaussion fitting, wurtzite CdZnO structure and rock-salt CdZnO structure exist in the CdZnO well layers. The rock-salt structures may dominate over the wurtzite structures in photoluminescence intensity when the total Cd content is high.
Subjects
InGaN/GaN
CdZnO/ZnO
Quantum-well
Photoluminescence
PL
Type
thesis
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