Skip to main content
English
中文
Log In
Log in
Log in with ORCID
NTU Single Sign On
Have you forgotten your password?
Home
College of Electrical Engineering and Computer Science / 電機資訊學院
Electronics Engineering / 電子工程學研究所
Experimental Results for Slow Speed Testing
Details
Experimental Results for Slow Speed Testing
Journal
IEEE VLSI Test Symposium
Date Issued
2002-01
Author(s)
CHIEN-MO LI
C.W.Tseng
J.C.M. Li
E. J. McCluskey
CHIEN-MO LI
DOI
10.1109/VTS.2002.1011108
URI
http://scholars.lib.ntu.edu.tw/handle/123456789/299318
Type
conference paper