Enhancing testability of VLSI arrays for fast Fourier transform

Resource

Computers and Digital Techniques, IEE Proceedings-

Journal

Computers and Digital Techniques, IEE Proceedings-

Pages

-

Date Issued

1993-05

Date

1993-05

Author(s)

Lu, S.-K.

Wu, C.-W.

Kuo, S.-Y.

DOI

1350-2387

URI

Type

journal article

File(s)

Name

00216580.pdf

Size

443.75 KB

Format

Adobe PDF

Checksum

(MD5):d73b9e663ea3fa3c0848a538b7a6e0c4