Reflow and Burn-in of a Sn-20ln-0.8Cu Ball Grid Array Package with a Au/Ni/Cu Pad
Journal
Journal of Electronic Materials
Journal Volume
33
Journal Issue
1
Pages
34-39
Date Issued
2004
Author(s)
Abstract
The intermetallic compounds formed after reflow and burn-in testing of a Sn-20In-0.8Cu solder ball grid array (BGA) package are investigated. Along with the formation of the Cu6(Sn0.78In0.22) 5 precipitates (IM1) in the solder matrix, scallop-shaped intermetallic compounds (IM2) with a compositional mixture of Cu 6(Sn0.87In0.13)5 and Ni 3(Sn0.87In0.13)4 appear at the interfaces between the solder balls and Au/Ni/Cu pads. A significant number of intermetallic particles (IM3), with a composition of (Au0.80Cu 0.20)(In0.33Sn0.67)2, can also be found in the solder matrix. After aging at 115°C for 750 h, an additional intermetallic compound layer (IM4) with a composition of (Ni 0.91Cu0.09)3(Sn0.77In 0.23)2 is formed at the interface between IM2 and the Ni layer. The ball shear strength of the Sn-20In-0.8Cu BGA solder after reflow is 4.5 N and will rise to maximum values after aging at 75°C and 115°C for 100 h. With a further increase of the aging time at both temperatures, the joint strengths exhibit a tendency to decline linearly at about 1.7 × 10-3 N/h.
Type
journal article