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College of Science / 理學院
Physics / 物理學系
Strain relaxation in In0.2Ga0.8As/GaAs quantum-well structures by x-ray diffraction and photoluminescence
Details
Strain relaxation in In0.2Ga0.8As/GaAs quantum-well structures by x-ray diffraction and photoluminescence
Journal
Journal of Applied Physics
Journal Volume
87
Journal Issue
3
Pages
1251-1254
Date Issued
2000
Author(s)
Chen, J.F.
Wang, P.Y.
Wang, J.S.
Chen, N.C.
Guo, X.J.
YANG-FANG CHEN
URI
http://www.scopus.com/inward/record.url?eid=2-s2.0-0012719051&partnerID=MN8TOARS
http://scholars.lib.ntu.edu.tw/handle/123456789/288625
Type
journal article