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College of Electrical Engineering and Computer Science / 電機資訊學院
Electrical Engineering / 電機工程學系
Film Thickness Dependence of Surface Plasmon Resonance Behavior at a Grating Structure of Highly Ga-Doped ZnO
Details
Film Thickness Dependence of Surface Plasmon Resonance Behavior at a Grating Structure of Highly Ga-Doped ZnO
Journal
Physica Status Solidi (A) Applications and Materials Science
Date Issued
2020
Author(s)
Liu, C.-W.
Chen, C.-C.
Cheng, Y.-C.
Chen, P.-Y.
Chang, W.-Y.
Kuo, Y.
YEAN-WOEI KIANG
CHIH-CHUNG YANG
DOI
10.1002/pssa.202000150
URI
https://www.scopus.com/inward/record.url?eid=2-s2.0-85087204204&partnerID=40&md5=31567bd4bb20d09a95c1d5466c55275a
https://scholars.lib.ntu.edu.tw/handle/123456789/559326
Type
journal article