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College of Electrical Engineering and Computer Science / 電機資訊學院
Electrical Engineering / 電機工程學系
A scalable built-in self-test/self-diagnosis architecture for 2D-mesh based chip multiprocessor systems
Details
A scalable built-in self-test/self-diagnosis architecture for 2D-mesh based chip multiprocessor systems
Journal
IEEE International Symposium on Circuits and Systems
Pages
2317-2320
Date Issued
2009
Author(s)
AN-YEU(ANDY) WU
Lin, S.-Y.
Hsu, C.-C.
AN-YEU(ANDY) WU
DOI
10.1109/ISCAS.2009.5118263
URI
http://www.scopus.com/inward/record.url?eid=2-s2.0-70350170720&partnerID=MN8TOARS
http://scholars.lib.ntu.edu.tw/handle/123456789/350712
Type
conference paper