Electromagnetic interferences caused by the common-mode noises from stacked I/O connectors and their treatments
Journal
2010 IEEE International Conference on Wireless Information Technology and Systems, ICWITS 2010
Date Issued
2010
Author(s)
Abstract
The electromagnetic interferences (EMI) caused by noises resulted from the common mode of stacked I/O connectors are analyzed using both numerical simulations and experimental measurements. A strategy is presented to suppress the noise level and its emission as well, which is found to be very effective as shown in our examination.
SDGs
Type
conference paper