Study of Applying Ultra-Broadband Amplified Spontaneous Emission of Cr:YAG to Optical Low Coherence Reflectometry
Date Issued
2007
Date
2007
Author(s)
Wang, Yu-Ta
DOI
en-US
Abstract
Based on white-light interferometry, optical low coherence reflectometry (OLCR) has emerged as a promising technique for obtaining high-axial-resolution measurements for fiber optic, integrated optic, and thin film structures. Recent OLCR modules incorporating superluminescent diodes have achieved high resolution of 10-15 um. However, for applications to biological and medical diagnostics, higher imaging resolution is required.
We have successfully developed a novel broadband light source, on the basis of a double-clad Cr+4:YAG crystal fiber, generating broadband ASE centered at 1.38 um with a bandwidth of 265 nm by an 1064-nm Yb fiber pump laser. In the research, the light source of the OLCR system was implemented with the Cr:YAG fiber. The point spread function (PSF) of the system was obtained by placing a gold-plated mirror as a sample, and a 5.1-um axial resolution in free space was experimentally demonstrated. Simulation was performed to analyze the relationship between the lineshape of the light source to the corresponding PSF. Finally we prepared a 3-um thick TiO2 coated sample for depth scanning, and successfully distinguished the adjacent refractive index interfaces.
Subjects
掺
鉻釔鋁石榴石
自發放大輻射
光學低同調掃描
光源
Cr:YAG
ASE
OLCR
light source
Type
thesis
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