Experimental study of a coplanar strip-line based high-speed device interconnect
Journal
Materials Chemistry and Physics
Journal Volume
45
Journal Issue
1
Pages
67-70
Date Issued
1996
Author(s)
Abstract
Photoconductive switches fabricated by compatible microwave device processing techniques are used for on-wafer characterization of a long high-frequency interconnect exceeding 160-GHz measurement bandwidth. The origin of the slow tail associated with the electrical pulse propagating on the coplanar strip line is experimentally verified as resulting from the distributed resistance of the metal strip line. Full characterization of this interconnect structure is an important issue for the monolithic integration of microwave/millimeter-wave circuits.
SDGs
Type
journal article