Scanning second-harmonic/third-harmonic generation microscopy of gallium nitride
Resource
Applied Physics Letters 77 (15): 2331-2333
Journal
Applied Physics Letters
Journal Volume
77
Journal Issue
15
Pages
2331-2333
Date Issued
2000
Author(s)
Abstract
Scanning second-harmonic generation and third-harmonic generation microscopy of a gallium nitride (GaN) sample was demonstrated using a femtosecond Cr:forsterite laser. Taking advantage of the electric-field enhanced second-harmonic generation effect and bandtail state resonance effect, the obtained second-harmonic and third-harmonic generation microscopic images revealed the piezoelectric field and bandtail state distributions in a GaN sample. © 2000 American Institute of Physics.
Type
journal article
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