Thin-film boundary conditions
Journal
Microwave and Optical Technology Letters
Journal Volume
5
Journal Issue
13
Pages
682--685
Date Issued
1992
Author(s)
Abstract
Abstract A set of boundary conditions for general thin‐film structures is derived, which includes special cases of a resistive card and a thin coating over perfect electric conductors. The use of such boundary conditions in an analytical method, the method of moments, or the finite element method offers three distinct advantages: (i) the boundary conditions are much simpler, which makes the integral equation or the variational equation formulation simpler, (ii) the number of unknowns is reduced, and (iii) the numerical solution is more stable. © 1992 John Wiley & Sons, Inc.
Type
journal article