Mapping the three-dimensional stress distribution of GaN-based light emitting diode with confocal Raman and photoluminescence spectromicroscope
Journal
Annual Meeting of the Physical Society of R.O.C.
Date Issued
2015
Author(s)
Description
Jan. 28-30, 2015, Hsinchu, Taiwan. (Poster, P1-OE-112)
Type
poster