Research on Advanced Organic Light-Emitting Devices Structure
Date Issued
2007
Date
2007
Author(s)
Tseng, Chin-An
DOI
en-US
Abstract
In this thesis, we study the degradation phenomena in a mixed-host (MH) organic light-emitting device (OLED) by using ultra-thin probe method. We observed spectral shift and then stable during the aging process, which results from materials decay. Non-uniform materials degradation with time at different positions of the MH emitting layer (EML) is observed by using photoluminescence measurement to define the intrinsic decay of materials. The decay rate exhibits similar trends to the recombination distribution in the MH-EML, which means degradation is a heat-assisted process.
Besides, we used a novel material, 1,1'-bis(2-phenyl-1,3,4-oxadiazol-5-yl) ferrocene (Fe-OXD), as electron transport layer (ETL) material which reduces the turn-on voltage by 2.2V at the current density 25mA/cm2 as compared to the conventional OLED. ETL and hole-transport layer materials are used as the host of the EML in a red phosphorescent, which shows a high efficiency of 14.3cd/A and a 2.5V lower driving voltage at 14mA/cm2.
Subjects
有機發光元件
有機發光二極體
混合層結構
劣化
磷光
organic light-emitting device
OLED
mixed host
degradation
phosphorescent
Type
thesis
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