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College of Liberal Arts / 文學院
Linguistics / 語言學研究所
Dynamic analog testing via ATE digital test channels
Details
Dynamic analog testing via ATE digital test channels
Journal
13th Asian Test Symposium
Pages
308--312
Date Issued
2004
Author(s)
Su, CC
Chang, CS
Huang, HW
Tu, DS
Lee, C-L
Lin, Jerry CH
CHIA-LIN LEE
URI
http://scholars.lib.ntu.edu.tw/handle/123456789/307875
Type
conference paper