Enhanced Controllability for IDDQ Test Sets Using Partial Scan.
Journal
Proceedings of the 28th Design Automation Conference, San Francisco, California, USA, June 17-21, 1991.
Pages
278-281
Date Issued
1991
Author(s)
Abstract
It has been shown that the advantages of IDDQ testing for stuck-at faults are reduced test set size, increased fault coverage, and faster test generation time. Untestability due to poor observability is eliminated. However, untestability due to poor controllability still remains and affects the IDDQ test results. The authors introduce the concept of partial scan in IDDQ test generation process. This results in increased controllability, and hence, reducing untestable faults in IDDQ test results. Moreover, resulting test sets are further reduced and overall test generation time is improved.
Type
conference paper