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College of Electrical Engineering and Computer Science / 電機資訊學院
Electronics Engineering / 電子工程學研究所
Charge confinement in silicon nanowires by surface functionalization
Details
Charge confinement in silicon nanowires by surface functionalization
Journal
2011 NSTI Nanotechnology Conference and Expo, NSTI-Nanotech 2011
Journal Volume
1
Pages
484-487
Date Issued
2011
Author(s)
CHIH-TING LIN
Shih, Y.C.
Lee, J.H.
Lin, C.T.
Chen, C.S.
Wu, K.C.
CHIH-TING LIN
URI
http://www.scopus.com/inward/record.url?eid=2-s2.0-81455133704&partnerID=MN8TOARS
http://scholars.lib.ntu.edu.tw/handle/123456789/364773
Type
conference paper