Characterization of 1/f noise vs. number of gate stripes in MOS transistors.

Journal

Proceedings of the 1999 International Symposium on Circuits and Systems, ISCAS 1999, Orlando, Florida, USA, May 30 - June 2, 1999

Pages

310-313

Date Issued

1999

Author(s)

Chen, Hsin-Shu

Ito, A.

DOI

URI

URL

Type

conference paper