Threading dislocation induced low frequency noise in strained-Si nMOSFETs

Journal

IEEE Electron Device Letters

Journal Volume

26

Journal Issue

9

Pages

667-669

Date Issued

2005

Author(s)

Hua, W.-C.

Lee, M.H.

Chen, P.S.

Tsai, M.-J.

DOI

10.1109/LED.2005.853672

URI

http://www.scopus.com/inward/record.url?eid=2-s2.0-26444520423&partnerID=MN8TOARS

http://scholars.lib.ntu.edu.tw/handle/123456789/316572

SDGs

[SDGs]SDG7

Type

journal article