Persistence and charge diffusion in an E2V CCD42-90 deep-depletion CCD
Journal
Proceedings of SPIE - The International Society for Optical Engineering
Journal Volume
8453
ISBN
9780819491541
Date Issued
2012
Author(s)
Abstract
The ESPaDOnS spectrograph at the Canada-France-Hawaii Telescope was recently upgraded to use an E2V CCD42-90 deep-depletion CCD. While changing to this device from a standard silicon CCD42-90 had many benefits such as much higher red QE and much lower fringing, it was also found that the new device exhibited persistence. After talking with E2V, a solution to the persistence was found, but this resulted in reduced resolution on the spectrograph from charge diffusion. This paper will describe the solution found to allow the detector to run with no persistence and with limited charge diffusion. ? 2012 SPIE.
Subjects
CCD
CFHT
Charge diffusion
ESPaDOnS
Persistence
Residual surface image
SDGs
Type
conference paper