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College of Electrical Engineering and Computer Science / 電機資訊學院
Electrical Engineering / 電機工程學系
Fermi-level shifts in graphene transistors with dual-cut channels scraped by atomic force microscope tips
Details
Fermi-level shifts in graphene transistors with dual-cut channels scraped by atomic force microscope tips
Journal
Applied Physics Letters
Journal Volume
104
Journal Issue
2
Date Issued
2014
Author(s)
Lin, M.-Y.
Chen, Y.-H.
Su, C.-F.
Chang, S.-W.
Lee, S.-C.
Lin, S.-Y.
SI-CHEN LEE
DOI
10.1063/1.4862275
URI
http://www.scopus.com/inward/record.url?eid=2-s2.0-84893086408&partnerID=MN8TOARS
http://scholars.lib.ntu.edu.tw/handle/123456789/387425
Type
journal article